기계공학부 구성원들의 많은 관심과 참여 부탁드립니다.

▣ 주   제: Multi-dimensional structured illumination microscopy and Dark Sectioning

▣ 연   사: Prof. Peng Xi

▣ 소   속: Peiking Univ.

▣ 일   시: 2025. 10. 28.(화) 10:00

▣ 장   소: 제4공학관 D510호

▣ 초   록

In this talk, I will discuss three key developments to tackle the fundamental problems of fluorescence microscopy: 1) We developed polarized structured illumination microscopy (Polar-SIM), which achieves super-resolution dipole imaging. Polar-SIM revealed the side-by-side organization of the actin ring structures in the membrane-associated periodic skeleton. 2) To alleviate photobleaching and improve the temporal resolution of 2D-SIM, we develop triangle-beam interference SIM (3I-SIM), which generates a 2D lattice pattern based on 3 radially polarized beam interference, which enhances the signal-to-noise ratio of the high-frequency components. 3) In fluorescence microscopy, a persistent challenge is the defocused background for thick specimen imaging. Here we present Dark sectioning, a pioneering de-background method that can improve almost all kinds of state-of-the-art fluorescence microscopy techniques.